Applied Materials has an opening for a Materials Characterization Intern, who will focus on structural characterization of MRAM and FINFET multi-laywer films by FIB and TEM.  A project on 3D imaging and tomographic reconstruction using FIB/SEM will be completed within the intern term.

They are looking for an undergraduate or graduate student in materials science, chemistry, electrical engineering or physics.

The hourly rate will be ~$18-20/hour.

Please share the attached job description with your students. They need to fill the position immediately.

Brief description from the company contact:

“We mainly provide TEM/FIB analysis to Intel and support their R & D projects.  To address customers’ increasing TEM/FIB requests and fast turnaround expectations, we are expanding our team and recruiting an intern to focus on TEM sample preparation by hands-on operation of the FIB/SEM dual beam system.  Our TEM/FIB lab is equipped with a state-of-the-art FEI Osiris TEM and an Helios 600 FIB/SEM.
 

If your students and graduates are interested in this position or are looking for an opportunity to get professional TEM/FIB experience in a world-famous semiconductor company, please encourage them to apply.  This position needs to be filled in immediately.  Thanks a lot.”