Applied Materials has an opening for a Materials Characterization Intern, who will focus on structural characterization of MRAM and FINFET multi-laywer films by FIB and TEM.\u00a0 A project on 3D imaging and tomographic reconstruction using FIB\/SEM will be completed within the intern term.<\/p>\n
They are looking for an undergraduate or graduate student in materials science, chemistry, electrical engineering or physics.<\/p>\n
The hourly rate will be ~$18-20\/hour.<\/p>\n
Please share the attached job description with your students. They need to fill the position immediately.<\/p>\n
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Brief description from the company contact:<\/p>\n
“We mainly provide TEM\/FIB analysis to Intel and support their R & D projects.\u00a0 To address customers’ increasing TEM\/FIB requests and fast turnaround expectations, we are expanding our team and recruiting an intern to focus on TEM sample preparation by hands-on operation of the FIB\/SEM dual beam system.\u00a0 Our TEM\/FIB lab is equipped with a state-of-the-art FEI Osiris TEM and an Helios 600 FIB\/SEM.<\/i>
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If your students and graduates are interested in this position or are looking for an opportunity to get professional TEM\/FIB experience in a world-famous semiconductor company, please encourage them to apply.\u00a0 This position needs to be filled in immediately.\u00a0 Thanks a lot.”<\/i><\/p>\n","protected":false},"excerpt":{"rendered":"
Applied Materials has an opening for a Materials Characterization Intern, who will focus on structural characterization of MRAM and FINFET multi-laywer films by FIB and TEM.\u00a0 A project on 3D imaging and tomographic reconstruction using FIB\/SEM will be completed within the intern term. They are looking for an undergraduate or graduate student in materials science,… Continue reading